by Vasile Grosu and Nicolae Patache
Journal of Engineering Research and Sciences, Volume 5, Issue 7, Page # 1-15, 2026; DOI: js0507001
Abstract: In recent times, machine learning applications have become an important component of the analog integrated circuit development cycle. Several phases such as circuit sizing, optimization or pre-silicon verification have benefited from machine learning automation. For developing such machine learning models, a certain amount of training and testing samples needs to be acquired through circuit simulations.… Read More

(This article belongs to the Special Issue on SP8 (Special Issue on Digital and Engineering Transformations in Science and Technology (SI-DETST-26)) and the Section Electronic Engineering (EEE))